LabVIEW cover Updates and Ancillary Materials for
Hands-On Introduction to LabVIEW for Scientists and Engineers, Second Edition

 

Bio

John Essick is a solid-state physics experimentalist whose research interests center on the optoelectronic properties of semiconductors and teaching interests on advanced laboratory development. He has been a professor in the Reed College Physics Department since 1993, where he is currently the David W. Brauer Professor of Physics. Prior to his position at Reed, he was a professor in the Physics Departments of Occidental College and California State Polytechnic University, Pomona.

Essick’s doctoral work investigated the defect states in hydrogenated amorphous silicon using capacitance-based techniques. While at Reed, he has supervised 62 yearlong senior thesis projects on semiconductor topics including crystalline & amorphous silicon, novel III/V materials and quantum dots as well as his other interests in quantum optics and laser-based atom trapping.

Essick has been active in upper-division instructional laboratory development throughout his teaching career. He is on the Advanced Laboratory Physics Association (ALPhA) Board of Directors, has served on the organizing committees for the Conference on Laboratory Instruction Beyond the First Year (BFY) of College conferences and ALPhA Immersions, hosted an ALPhA Immersion, and is author of the textbook Hands-On Introduction to LabVIEW for Scientists and Engineers. Essick is editor of the Apparatus and Demonstration Notes section of the American Journal of Physics.

Education

  • Ph.D. 1988 University of Oregon
  • M.S. 1978 University of California, Los Angeles
  • B.S. 1976 University of California, Berkeley

Recent Publications

  • Neal Woo and John Essick, “Determining the Muon Mass Using a Scintillator-Based Detector,” Am J. Phys. 85, 611 (2017)
  • J. Essick, Hands-On Introduction to LabVIEW for Scientists and Engineers, Third Edition, Oxford University Press, May 2015
  • N. Reynolds, C. Panda, and J. Essick, "Capacitance-Voltage Profiling: Research-Grade Approach versus Low-Cost Alternatives," Am. J. Phys. 82, 196 (2014).
  • B. Brau, C May, R. Ormond, and J. Essick, “Determining the Muon Mass in an Instructional Laboratory, ” Am J. Phys. 78, pp. 64-70 (2010).
  • Z.M. Schultz and J.M. Essick, “Investigation of Exciton Ground State in Quantum Dots via Hamiltonian Diagonalization Method,” Am. J. Phys. 76, 241 (2008).